Yifei Huang
Ph.D Institute of Microelectronics, Chinese Academy of Sciences
B.S. Xi'an University of Posts and Telecommunications
- Yifei Huang received the B.S. degree from Xi'an University of Posts and Telecommunications, Xi'an, China, in 2020, and her Ph. D. degree from Institute of Microelectronics, Chinese Academy of Sciences, Beijing, China, in 2025. She is currently a postdoctoral fellow in the Department of Electrical and Electronic Engineering at The University of Hong Kong. Her research interests include the reliability characterization, and physics of failure of wide-bandgap power semiconductor devices.
- Link:Google Scholar